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Joint Test Action Group |
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No references found | First, and chief among them, is that related to the IEEE 1149. 7 standard, a new two-pin test and debug interface standard that supports half the number of pins of the IEEE 1149. Meanwhile, other vendors of programmable logic devices can use the open Java API for Boundary Scan for online configuration, using the IEEE's 1149. |
1149.1 |
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