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AFM |
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AFM(Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. Invented by IBM in 1986, it uses a ceramic or semiconductor tip one atom wide positioned at the end of a cantilevered bar. As the tip is moved over the material, it either continously touches or periodically taps the surface and bends as it is repelled or attracted to the structure. A laser picks up the deflections. How to thank TFD for its existence? Tell a friend about us, add a link to this page, add the site to iGoogle, or visit webmaster's page for free fun content. |
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Coordinating the project are (r to 1) HFM Pres Loyd Brown, AFM/ARA, and
HFM Farm Mgrs Sterling Young, AFM and Tim Fevold, AFM. For both feats, the IBM researchers first wired an AFM tip to
accept up to 10 volts. The EnviroScope AFM with EC
permits polymer studies in various environments, including
controlled-humidity measurements. |
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