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AFM

   Also found in: Dictionary/thesaurus, Financial, Acronyms, Wikipedia, Hutchinson 0.03 sec.
AFM
(Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. Invented by IBM in 1986, it uses a ceramic or semiconductor tip one atom wide positioned at the end of a cantilevered bar. As the tip is moved over the material, it either continously touches or periodically taps the surface and bends as it is repelled or attracted to the structure. A laser picks up the deflections.

In contrast to a scanning tunneling microscope (STM), which sends current to the surface being measured, AFMs can be used to image non-conductive materials. See probe storage, STM, microscopy and nanotechnology.


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Summary: TEHRAN (FNA)- Iranian scientists managed to make Atomic Force Microscope to put Iran among ten AFM manufacturing countries.
AFM is among several fund management firms bidding to run the new pounds 140m venture fund for the whole North West region.
This manufacturer of products for atomic force/scanning probe microscopy (AFM/SPM) has introduced the Cypher AFM for small samples.
 
 
 
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