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AFM |
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AFM (Atomic Force Microscope) A device used to image materials at the atomic level. AFMs are used to solve processing and materials problems in electronics, telecom, biology and other high-tech industries. Invented by IBM in 1986, it uses a ceramic or semiconductor tip one atom wide positioned at the end of a cantilevered bar. As the tip is moved over the material, it either continously touches or periodically taps the surface and bends as it is repelled or attracted to the structure. A laser picks up the deflections.In contrast to a scanning tunneling microscope (STM), which sends current to the surface being measured, AFMs can be used to image non-conductive materials. See probe storage, STM, microscopy and nanotechnology. Want to thank TFD for its existence? Tell a friend about us, add a link to this page, add the site to iGoogle, or visit the webmaster's page for free fun content. |
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