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atomic force microscope |
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atomic force microscope (AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material. Unlike the scanning tunneling microscope scanning tunneling microscope, device for studying and imaging individual atoms on the surfaces of materials. The instrument was invented in the early 1980s by Gerd Binnig and Heinrich Rohrer, who were awarded the 1986 Nobel prize in physics for their work. ..... Click the link for more information. , which is also a scanning probe microscope, the AFM can be used on materials that do not conduct electricity. In the original AFM, the probe traverses the surface, moving upward due to bumps and downward due to depressions; a laser laser [acronym for light amplification by stimulated emission of radiation], device for the creation, amplification, and transmission of a narrow, intense beam of coherent light . ..... Click the link for more information. beam reflected from the tip of the probe measures the up and down movements, and the pattern of reflected light creates an image of the surface. Another type of AFM measures the sideways deflection of the tip caused by friction as the probe moves across the surface; differences in friction can be used distinguish different atoms and molecules on the material. A third variation employs a magnetic probe; this probe does not touch the material but moves up and down in reaction to the magnetic forces between the tip and the surface. In a microchip-size AFM, the electronic circuitry and multiple probes are integrated on a sliver of silicon; although less sensitive than a full-size AFM, the device has applications in microelectronics microelectronics, branch of electronic technology devoted to the design and development of extremely small electronic devices that consume very little electric power. ..... Click the link for more information. where the multiple probes make it possible to record images very quickly. atomic force microscopeSee AFM. atomic force microscope [ə¦täm·ik ¦fȯrs ′mī¦krə‚skōp] (engineering) A device for mapping surface atomic structure by measuring the force acting on the tip of a sharply pointed wire or other object that is moved over the surface. How to thank TFD for its existence? Tell a friend about us, add a link to this page, add the site to iGoogle, or visit webmaster's page for free fun content. |
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| Beyond GEM4, however, there are other consortia of mission-complementary higher ed partners now applying atomic force microscopy, laser tweezers, and nanoscale staples to spur new discoveries in human genome experimentation--fighting diseases like botulism, malaria, sickle cell anemia, and pancreatic cancer. Scanning electron and atomic force microscopy was used for the first time to view the maturation of the severe acute respiratory syndrome-associated coronavirus at the cell surface. His contributions in developing tapping phase and force modulation atomic force microscopy techniques and his image processing techniques are the mainstay characterization methods for quantification of polymer blends and composites, most importantly for examining rubber compound morphologies and filler phase distribution. |
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