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The oxide layer chemical composition was studied using Auger Electron Spectroscopy (AES).
Secondary ion mass spectroscopy (SIMS) and auger electron spectroscopy (AES) applied to the fire investigation for short circuit, In Proc.
Auger electron spectroscopy (AES) is a surface sensitive analysis method for determining the elemental composition of solid materials.
Phosphors was often detected on the surface of the particles remaining after partial dissolution at 700[degrees]C, in examination by Auger electron spectroscopy.
Several characterization techniques including scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), and auger electron microscopy (AES) were used for the physical characterization of [Al.
An examination of the surface using Auger Electron Spectroscopy indicated that high levels of nickel and oxygen were present compared to as-plated samples.
While EDX provides useful composition information for relatively large particles, Auger electron spectroscopy (AES) is more conclusive for compositional analysis of defects in the submicron size range.
We determine such structures by Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES), after contamination-free transfer from solution to vacuum in a custom-designed apparatus.
In surface experiments such as Auger electron spectroscopy or x-ray fluorescence, the energetic particle is an electron.
Of these techniques, three main instruments have evolved: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS).
The probability to have a non-radiative transition with the emission of an Auger electron is (1-[omega]).
LEED devices are often combined with other ultra high vacuum (UHV) surface science techniques, notably Auger electron spectroscopy.