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Built-in Self Test

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Built-in Self Test - (BIST) The technique of designing circuits with additional logic which can be used to test proper operation of the primary (functional) logic.
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com), a leader in microprocessor emulation-based board test and debug, announced today that they have jointly developed support for Intel(R) Interconnect Built-In Self Test (Intel(R) IBIST) embedded test technology on International Test Technologies' MicroMaster functional test platform.
ASSET(R) and International Test Technologies Support CPU Functional ... by Business Wire
A[micro] Acronyms: A[micro] ATE: Automatic Test Equipment A[micro] ATPG: Automatic Test Program Generation A[micro] BIST: Built-In Self Test A[micro] BSD: Boundary Scan Design A[micro] DFD: Design for Debug/Diagnosis A[micro] DFT: Design For Test
SynTest Previews UltraScan to Reduce Cost of Testing for Nanometer ... by Business Wire
Seamless interface to third-party built-in self test (BIST) solutions with fully integrated diagnostic support
LTX Introduces Fusion EX - the New Benchmark for SOC Test ... by Business Wire
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