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electromigration

   Also found in: Acronyms, Wikipedia 0.07 sec.
(electronics)electromigration - Mass transport due to momentum exchange between conducting electrons and diffusing metal atoms. Electromigration causes progressive damage to the metal conductors in an integrated circuit. It is characteristic of metals at very high current density and temperatures of 100C or more.

The term was coined by Professor Hilbert Huntington in the late 1950s because he didn't like the German use of the word "electrotransport".

Mass transoport occurs via the Einstein relation J=DFC/kT where F is the driving force for the transoport. For electromigraiton F is z*epj and z* is an electromigration parameter relating the momentum exchange and z is the charge of the "diffusing" species.


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However, the researchers, who were then at the University of California, Berkeley, realized that this electromigration of atoms might offer them a delicate and precise way to create minute cracks in wires.
Shrinking toward the ultimate transistor; electronic devices go ... by Weiss, Peter Ulrich / Science News
The range of problems addressed includes the time evolution of complex solidification morphologies related to the casting of metals, the behavior of crystalline dislocations under stress, and surface electromigration on metals.
"Phase field" model of electrodeposition. (News Briefs) by Journal of Research of the National Institute of Standards and Technology
Working with Calibre-LVS, it extracts the rails in typical blocks in minutes with accurate resistance values and electromigration annotation, including for 45-degree lines.
Sequence Columbus-AMS Adds Statistically Accurate PVT Corners, ... by Business Wire
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