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field emission |
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field emission [′fēld ə‚mish·ən] (electronics) The emission of electrons from the surface of a metallic conductor into a vacuum (or into an insulator) under influence of a strong electric field; electrons penetrate through the surface potential barrier by virtue of the quantum-mechanical tunnel effect. Also known as cold emission. Field emission The emission of electrons from a metal or semiconductor into vacuum (or a dielectric) under the influence of a strong electric field. In field emission, electrons tunnel through a potential barrier, rather than escaping over it as in thermionic or photoemission. The effect is purely quantum-mechanical, with no classical analog. It occurs because the wave function of an electron does not vanish at the classical turning point, but decays exponentially into the barrier (where the electron's total energy is less than the potential energy). Thus there is a finite probability that the electron will be found on the outside of the barrier. See Photoemission, Quantum mechanics, Thermionic emission For a metal at low temperature, the process can be understood in terms of the illustration. The metal can be considered a potential box, filled with electrons to the Fermi level, which lies below the vacuum level by several electronvolts. The distance from Fermi to vacuum level is called the work function, &phgr;. The vacuum level represents the potential energy of an electron at rest outside the metal, in the absence of an external field. In the presence of a strong field, the potential outside the metal will be deformed along the line AB, so that a triangular barrier is formed, through which electrons can tunnel. Most of the emission will occur from the vicinity of the Fermi level where the barrier is thinnest. See Electron emission How to thank TFD for its existence? Tell a friend about us, add a link to this page, add the site to iGoogle, or visit webmaster's page for free fun content. |
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| The Display FDP Expo will feature LCDs, plasma displays, organic electroluminescence displays (OELDs), inorganic electroluminescence displays, field emission displays (FEDs), surface-conduction Electron-emitter displays (SEDs), electronic papers, touch panels and many other exhibitions. The October issue includes: an interview with a Motorola executive on the possibility of the licensing of field emission display technology; the success in the formation on nano-structural order with silicon cluster beams; short-term industry commercialization opportunities; and, a summary of corporate news. In collaboration with Sandia National Laboratory, NIST is developing procedures for analyzing the crystallographic phase of individual sub-200 nm particles utilizing electron backscatter diffraction (EBSD) in the field emission scanning electron microscope. |
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