magnetic force microscopy

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magnetic force microscopy

[mag¦ned·ik ¦fȯrs mī′krä·skə·pē]
(engineering)
The use of an atomic force microscope to measure the gradient of a magnetic field acting on a tip made of a magnetic material, by monitoring the shift of the natural frequency of the cantilever due to the magnetic force as the tip is scanned over the sample.
References in periodicals archive ?
Other Types of Microscopes II-26 Elasticity Microscopes II-26 Magnetic Force Microscopes II-26 Force Modulation Microscopes II-26 Pol-Scope and Differential Interference Contrast (DIC)
Combines Atomic Force and Magnetic Force Microscopes with Company's Proven Metrology Platforms -- Company Worked Closely with Major Microelectronics Customers in Developing New Product Line -- Initial Use Will Be for Sub-Nanometer Inspection of Disk Drive Media
They were followed in subsequent years by Atomic Force Microscopes (AFMs) and Magnetic Force Microscopes (MFMs) to probe other aspects of material surfaces at the angstrom, or sub-nanometer feature-size scale.