magnetic force microscopy

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magnetic force microscopy

[mag¦ned·ik ¦fȯrs mī′krä·skə·pē]
(engineering)
The use of an atomic force microscope to measure the gradient of a magnetic field acting on a tip made of a magnetic material, by monitoring the shift of the natural frequency of the cantilever due to the magnetic force as the tip is scanned over the sample.
References in periodicals archive ?
They then used a magnetic force microscope to demonstrate the material's local write-read-erase multi-functionality at room temperature.
Magnetic Force Microscope, which can image naturally occurring and deliberately written domain structures in magnetic materials.
The magnetic force microscope is a modification of the noncontact-mode SFM.
For example, researchers can use a magnetic force microscope (MFM) equipped with a nickel wire cantilever tip to image the magnetization patterns of magnetic recording materials.
PHOTO : left) are revealed with a magnetic force microscope by researchers at IBM.
of Maryland, College Park, and his research team are studying localized magnetic properties under conditions not previously possible with magnetic force microscopes (MFMs).
These new instruments include atomic force microscopes, magnetic force microscopes, and scanning capacitance microscopes.
Combines Atomic Force and Magnetic Force Microscopes with Company's Proven Metrology Platforms -- Company Worked Closely with Major Microelectronics Customers in Developing New Product Line -- Initial Use Will Be for Sub-Nanometer Inspection of Disk Drive Media
They were followed in subsequent years by Atomic Force Microscopes (AFMs) and Magnetic Force Microscopes (MFMs) to probe other aspects of material surfaces at the angstrom, or sub-nanometer feature-size scale.