electromigration

(redirected from Metal migration)

electromigration

[i¦lek·trō·mī′grā·shən]
(analytical chemistry)
A process used to separate isotopes or ionic species by the differences in their ionic mobilities in an electric field.
(physical chemistry)
The movement of ions under the influence of an electrical potential difference.

electromigration

(electronics)
Mass transport due to momentum exchange between conducting electrons and diffusing metal atoms. Electromigration causes progressive damage to the metal conductors in an integrated circuit. It is characteristic of metals at very high current density and temperatures of 100C or more.

The term was coined by Professor Hilbert Huntington in the late 1950s because he didn't like the German use of the word "electrotransport".

Mass transoport occurs via the Einstein relation J=DFC/kT where F is the driving force for the transoport. For electromigraiton F is z*epj and z* is an electromigration parameter relating the momentum exchange and z is the charge of the "diffusing" species.
References in periodicals archive ?
com)-- The comprehensive handbook indexes the regulations or standards for over 80 countries and economic areas, listing the relevant test methods and metal migration limits in an easy-to-use table.
GREENGUARD Synthetic Turf Certification ensures that synthetic turf components meet stringent requirements for chemical emissions, lead content and heavy metal migration that are certified by independent laboratories.
In the presence of moisture and an electric field, electrolytic metal migration occurs when metal ions migrate to a cathodically (negatively) charged surface and form dendrites.
A crack, like a void, also can experience metal migration and become plated.
In addition, the FDA concluded that if the tantalum surface remains chemically inert and resistant to corrosion and abrasion under their intended conditions of use, there is little to no risk of food contamination, leaching, or metal migration.
There are a number of recall cases related to this heavy metal migration.
The GREENGUARD Synthetic Turf Components Certification ensures that synthetic turf components meet stringent, third-party requirements for chemical emissions, lead content, and heavy metal migration.
Terry Munson, "Eliminating Metal Migration Failures, Printed Circuit Fabrication, November 1998.
However, the ICP-MS can also be used for trace metal migration in food contact studies, nano-particle and nuclear applications.
The net result of metal migration can be either a reduction in insulation resistance or a short circuit which may lead to circuit failure.
The minimum electrical conductor spacing defined in IPC-2221 is not based on metal migration failure mechanisms.