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scan design |
Also found in: Wikipedia | 0.07 sec. |
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A[micro] Acronyms: A[micro] ATE: Automatic Test Equipment A[micro] ATPG: Automatic Test Program Generation A[micro] BIST: Built-In Self Test A[micro] BSD: Boundary Scan Design A[micro] DFD: Design for Debug/Diagnosis A[micro] DFT: Design For Test DFTAdvisor automatically adds test logic to correct problems with design testability, providing control of such things as internally-generated clocks, sets and resets which do not comply with scan design rules. In other words, the larger the scan design, the larger the saving in simulation time when using TDS_SimValidator DAS mode. |
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