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single-event upset
(redirected from Single event upset)

   Also found in: Acronyms, Wikipedia 0.01 sec.
single-event upset [¦siŋ·gəl i¦vent ′əp‚set]
(electronics)
A change in the state of a logic device from 0 to 1 or vice versa, as the result of the passage of a single cosmic ray.


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The RHBD Toolkit includes models and tools which provide a modeling and analysis capability for Single Event Upset (SEU) behaviors in deep sub-micro processes.
Single Event Latch up (SEL) is physically impossible and Single Event Upset (SEU) is better than 10-9 errors per bit / day, offering intrinsic radiation tolerance and total dose radiation testing of 100 Krads (Si).
A superior resistance to Single Event Upset (SEU) of less than 10-9 errors per bit-day and tolerance to total dose radiation of up to 100 Krads (Si) make these devices ideal for the demanding rigors of space applications.
 
 
 
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