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single-event upset
(redirected from Single event upset)

   Also found in: Acronyms, Wikipedia 0.03 sec.
single-event upset [¦siŋ·gəl i¦vent ′əp‚set]
(electronics)
A change in the state of a logic device from 0 to 1 or vice versa, as the result of the passage of a single cosmic ray.


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It is capable of 1,200 MIPS performance at a Single Event Upset (SEU) rate of 1E-4 unrecoverable errors/day using only 7-9 Watts of power.
Based upon a 6700-class digital signal processor from Texas Instruments, it is capable of 900 MFLOPS (million floating-point operations per second) performance at a Single Event Upset (SEU) rate of 1E-4 unrecoverable errors/day using only 5-7 Watts of power.
Featuring excellent Single Event Upset (SEU) Immunity of less than 10E-10 errors/bit-day; high-speed operation at less than 10nS; low-power at less than 150 mA (unloaded), the devices enable a standard interface protocol at higher speed and lower power than its competitors.
 
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