single-event upset

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single-event upset

[¦siŋ·gəl i¦vent ′əp‚set]
(electronics)
A change in the state of a logic device from 0 to 1 or vice versa, as the result of the passage of a single cosmic ray.
References in periodicals archive ?
SEEs include Single Event Upsets (SEUs), which are non-destructive or soft errors that can be corrected that may appear as transient pulses in logic or support circuitry, or as state changes in memory cells or registers as well as Single Event Latchups (SELs).
For equipment used in radiotherapy environments, designers also must consider the impact of single event upsets (SEUs) caused by ionizing radiation, which can lead to unintended and unexpected configuration changes.
In addition, the QL1P1000 is immune from Single Event Upsets (SEUs).
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