Test coverage


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Test coverage

(testing)
A measure of the proportion of a program exercised by a test suite, usually expressed as a percentage. This will typically involve collecting information about which parts of a program are actually executed when running the test suite in order to identify which branches of conditional statements which have been taken.

The most basic level of test coverage is code coverage testing and the most methodical is path coverage testing. Some intermediate levels of test coverage exist, but are rarely used.

The standard Unix tool for measuring test coverage is tcov, which annotates C or Fortran source with the results of a test coverage analysis. GCT is a GNU equivalent.
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Typically this will result in "OK" test coverage, but no one wants to be just OK
Superior test coverage on this type of product will include the use of boundary scan (FAG) technology.
This approach used on boards with an excess of 35,000 test points resulted in 95%+ test coverage.
Test engineers can then identify areas where test coverage can be improved.
This will allow test engineers to fine-tune the test coverage on the Agilent i3070 and i1000 even before test development, saving time, and costs.
With a test line combining a wide range of test and inspection equipment from various vendors, TestWay Coverage Analyst becomes mandatory to obtain precise and detailed reports, using impartial test coverage metrics," Christophe Lotz, managing director of ASTER Technologies, said.
Without DriveThru in boundary scan interconnect test, this additional test coverage would not have been possible, unless physical test access were available on the interconnect nodes.
This improves the test coverage as it includes the presence test for the series resistors.
On one customer design, which contains five boundary scan enabled devices including a ColdFire CPU, three Xilinx FPGAs and an Ethernet controller, we have got test coverage up consistently to around the 95-98% mark by using XJTAG - this has helped us to significantly improve our yields.
com), the PCI-200EJ controller increases test coverage by supporting ScanWorks' JTAG operations and the functional testing capabilities of ITT's [acute accent]Master emulation testers.
We have been able to consistently get development boards up and running in hours as opposed to days or weeks; flash programming time has been drastically reduced (in one case from 4 hours to 8 minutes); test coverage is well over the 90% mark; and we are making steady improvements to our production line test times.
The XJIO board improves the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections.