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PDP-11

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PDP-11

Programmed Data Processor model 11.

A series of minicomputers based on an instruction set designed by C. Gordon Bell at DEC in the early 1970s (late 60s?). The PDP-11 family, which came after, but was not derived from, the PDP-10, was the most successful computer of its time until it was itself succeeded by the VAX.

Models included the 11/23 and 11/24 (based on the F11 chipset); 11/44, 11/04, 11/34, 11/05, 11/10, 11/15, 11/20, 11/35, 11/40, 11/45, 11/70, 11/60 (MSI and SSI); LSI-11/2 and LSI-11 (LSI-11 chipset). In addition there were the 11/8x (J11 chipset) and SBC-11/21 (T11 chip) and then there was compatibility mode in the early VAX processors.

The B and C languages were both used initially to implement Unix on the PDP-11. The microprocessor design tradition owes a heavy debt to the PDP-11 instruction set.

See also SEX.
This article is provided by FOLDOC - Free Online Dictionary of Computing (foldoc.org)
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References in periodicals archive
Dennis Ritche (standing) and Ken Thomson working on the first computer for which they designed C (The PDP-11).
He designed and prepared specifications and system drawings, created new software, and modified existing software as necessary for the application of DEC Microvax and PDP-11 computer-based systems for process control and monitoring.
PDP-11 minicomputers for several years before the company switched to PC based controls software.
One thing that hasn't changed at Security is its choice of Digital Equipment Corp.'s PDP-11 minicomputer to support real-time, bidirectional communications with the presses (see PT, Dec.
Three PDP-11s at the Florida plant now supervise 78 presses, while the smaller Puerto Rico and Texas facilities have one PDP-11 each.
(Maynard, Mass.) PDP-11 acts as the controller for the automatic guided vehicles that pick up, transport, and deposit the pallet loads to the 16 truck docks and 5 rail docks of the facility.
A DEC PDP-11 computer and MTS computer interface provide test supervision, data acquisition, data analysis, amplitude control and function generation for the test system.
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