atomic force microscope


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Related to atomic force microscope: scanning electron microscope

atomic force microscope

(AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material, first developed by Gerd BinnigBinnig, Gerd
, 1947–, German physicist, Ph.D. Univ. of Frankfurt, 1978. At the IBM Research Laboratory in Zürich, Binnig and fellow researcher Heinrich Rohrer built the first scanning tunneling microscope, an instrument so sensitive that it can distinguish individual
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 in 1986. Unlike the scanning tunneling microscopescanning tunneling microscope
(STM), device for studying and imaging individual atoms on the surfaces of materials. The instrument was invented in the early 1980s by Gerd Binnig and Heinrich Rohrer, who were awarded the 1986 Nobel prize in physics for their work.
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, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct electricity. In the original AFM, the probe traverses the surface, moving upward due to bumps and downward due to depressions; a laserlaser
[acronym for light amplification by stimulated emission of radiation], device for the creation, amplification, and transmission of a narrow, intense beam of coherent light. The laser is sometimes referred to as an optical maser.
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 beam reflected from the tip of the probe measures the up and down movements, and the pattern of reflected light creates an image of the surface. Another type of AFM measures the sideways deflection of the tip caused by friction as the probe moves across the surface; differences in friction can be used distinguish different atoms and molecules on the material. A third variation employs a magnetic probe; this probe does not touch the material but moves up and down in reaction to the magnetic forces between the tip and the surface. In a microchip-size AFM, the electronic circuitry and multiple probes are integrated on a sliver of silicon; although less sensitive than a full-size AFM, the device has applications in microelectronicsmicroelectronics,
branch of electronic technology devoted to the design and development of extremely small electronic devices that consume very little electric power. Although the term is sometimes used to describe discrete electronic components assembled in an extremely small
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 where the multiple probes make it possible to record images very quickly.

atomic force microscope

[ə¦täm·ik ¦fȯrs ′mī¦krə‚skōp]
(engineering)
A device for mapping surface atomic structure by measuring the force acting on the tip of a sharply pointed wire or other object that is moved over the surface.
References in periodicals archive ?
Closer examination of the virus-induced changes at the subcellular surfaces of the infected cells, by using the hard tapping mode under the atomic force microscope, showed the involvement of the cell cytoskeleton at late infection.
UCL would like to invite suppliers to submit bids for supply of a Turnkey Integrated Atomic Force Microscope Glovebox System.
The atomic force microscope (ATM) has contributed dramatically to shrinking the scale at which scientists can make out details of objects.
The AFAM technique measures the frequencies of an atomic force microscope (AFM) cantilever's first two flexural resonances while in contact with a material.
PNI), the global leader in high-performance, easy-to-use, and affordable atomic force microscopes (AFMs), is pleased to announce the licensing of IBM's patent of the fundamental technology for the atomic force microscope.
Electron beam carbon deposition (EBD) was used to attach a carbon nanotube to a tungsten force probe and to an atomic force microscope (AFM) tip.
The UCLA team detected the vibrations while prodding the cells with an atomic force microscope.
Contract notice: Delivery of an atomic force microscope (afm) and equipment for the institute of electronic materials technology in warsaw.
Using an atomic force microscope, for example, researchers can mechanically place carbon nanotubes, one by one, on a chip.
ODC presented atomic force microscope profiles of an actual 8x-density compact disc master, recorded on an ODC Series 500 Mastering Module.
Contract award: university of cologne - atomic force microscope (afm).
One of today's celebrity scientific instruments, the atomic force microscope (AFM), is valued despite some quirks.