boundary scan


Also found in: Acronyms, Wikipedia.

boundary scan

The use of scan registers to capture state from device input and output pins. IEEE Standard 1149.1-1990 describes the international standard implementation (sometimes called JTAG after the Joint Test Action Group which began the standardisation work).
References in periodicals archive ?
Based on strong customer demand XJTAG has worked with Takaya's European distribution partner, Systech Europe, to create a powerful combination by integrating JTAG boundary scan with flying probe testing capabilities.
XJTAG Access Viewer overlays the extent of boundary scan access onto the schematic diagram, allowing users to instantly see which components are accessible using boundary scan, and where test coverage can be further extended.
While boundary scan is widely adopted, challenges are bound to happen during the implementation phase that will frustrate test and design engineers.
For its part, Keysight Technologies recently announced that its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the Intel micro-architecture codenamed Skylake.
Boundary scan has become an important limited access solution for printed circuit board assemblies, and includes tests for digital integrated circuits interconnection, as well as testing and programming digital devices such as flash, EEPROM and serial peripheral interface (SPI) devices.
Now that the test bus necessary for Boundary Scan is available on the UUT (unit under test), e.
Supplier of Automatic Test Equipment Teradyne Inc (NYSE:TER) disclosed on Monday that it has signed an agreement with boundary-scan software and hardware products and services technology company JTAG Technologies, to sell and distribute its Symphony/TS boundary scan product.
One derivative of boundary scan is when it is used to test non-boundary scan devices.
The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.
1, the IEEE Standard for Test Access Port and Boundary-Scan Architecture, is the foundation of the boundary scan standard that enables testing of the interconnect between two or more boundary scan devices.
Boundary scan can help resolve many of these issues.
Boundary scan interconnect and buswire test: Boundary scan test for interconnect pins between boundary scan devices.