cumulative error

(redirected from cumulative errors)

cumulative error

[′kyü·myə·ləd·iv ′er·ər]
(statistics)
An error whose magnitude does not approach zero as the number of observations increases. Also known as accumulative error.
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Irreproducibility is most often the result of unintentional cumulative errors or flaws in the research process, including reference materials, study design, laboratory protocols, data analysis and reporting," said Leonard P.
The labor market is suffering from grave cumulative errors that gave expatriate workers a competitive edge over Saudi workers, creating an environment that makes it impossible for the Ministry of Labor to solve the problems on its own, Ministry of Labor officials said yesterday.
Row pitch does not suffer the same ability for cumulative errors, except on multi-row/column components.
Further, the court held that the defendants' contentions, including its challenge to jury instructions and assertion that cumulative errors on the part of the trial court warranted a new trial, were not persuasive.
It said: "There was not one failing in this case that can conclusively be said to have been the major factor that failed to protect Alisha, rather a series of cumulative errors that were either not picked up or not pro-actively addressed.
In light of these cumulative errors, we find that your fitness to practise is impaired by reason of your lack of competence.
These cumulative errors suggest a purportedly ideal and invariable system that is in fact subject to incrementally slow but irreversible decay.
117) All of the federal circuits consider the effect of cumulative errors on direct review.
Although fairly sizable negative cumulative forecast errors continued into 2001:Q1, the persistent overestimation by forecasters of the strength of BFI spending caused these cumulative errors to become significantly positive by 2002:Q1.
It may seem that chained emulation risks cumulative errors analogous to those encountered in migration, but if program P renders a given gen-1 artifact properly under em1:2 when em1:2 is first written, P should continue to work the same way so long as em1:2 can be run.
By replacing wafer-based measurements with IntenCD maps, the time to decision shrinks from two days to as little as an hour, and accuracy improves by eliminating cumulative errors that can arise from multiple wafer processing steps.

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