diffractometry


Also found in: Dictionary, Wikipedia.

diffractometry

[‚di‚frak′täm·ə·trē]
(crystallography)
The science of determining crystal structures by studying the diffraction of beams of x-rays or other waves.
References in periodicals archive ?
The membranes were also detected by X-ray diffractometry (XRD, MaxRC, Rigaku, Japan).
Structure of the LDPE/clay nanocomposites was determined by Fourier Transform Infrared spectroscopy, (FTIR), x-ray diffractometry (XRD) and crosslinking density determination.
The power structure of materials was characterized by X-ray diffractometry (X Pert PRO DY2198, Holland).
Figures 8 and 9 show the relationships between tree acoustic velocity and the MOE and microfibril angle (MFA) of core samples from the trees measured by x-ray densitometry, diffractometry, and image analysis.
All bulk samples were scanned by X-ray diffractometry (XRD) from 5 to 45 degrees using Co Ka radiation.
Molecular modeling has also become one of the tools by which data from techniques such as NMR spectroscopy, x-ray diffractometry and electron microscopy are further analyzed and applied to a specific set of problems or used to generate new questions.
The researchers examined starch properties using differential scanning calorimetry, X-ray diffractometry, polarized light microscopy and other instrumental techniques.
This was followed by an x-ray diffractometry spectrum taken on a sample of black Santa Clara pottery that gave quite unexpected results.
Incoatec components and subunits enable scientists to form X-ray beams according to their individual requirements in various applications such as protein crystallography, high-resolution X-ray diffractometry and X-ray fluorescence spectrometry.
To explore the changes of the microstructure and components of oil shale, samples A, B and C were air dried and analyzed by scanning electron microscopy (SEM; Hitachi S-4800, Japan), infrared spectral analysis (IR; WQF-520, China), X-ray diffractometry (XRD; Shimadzu XRD-7000S/L, Japan) and X-ray fluorescence (XRF; Shimadzu MXF-2400, Japan).
Contract notice: High-resolution x-ray diffractometry.