ion migration

ion migration

[′ī‚än mī′grā·shən]
(electricity)
Movement of ions produced in an electrolyte, semiconductor, and so on, by the application of an electric potential between electrodes.
References in periodicals archive ?
A tradeoff of green materials and miniaturization is the risk of ion migration from flux residues that bridge the conductors.
ions and chemically bounded chlorides (Zybura 2007) and ion migration in concrete cover under the influence of an electric field during electrochemical chloride extraction process (Ali, Zybura 2008).
Besides corrosion and ion migration, dust can degrade computer reliability by entering electrical connectors.
The relative humidity threshold above which corrosion or ion migration can occur depends on the type of metal being corroded and the specific particulate or gaseous contamination (Rice et.
As explained above, even small amounts of magnesium chloride, and other salts with low deliquescent relative humidity, emanating from humidifiers can cause premature failure of the hardware through ion migration even under low relative humidity conditions.
Another phenomena accompanying the ion migration is the electrode polarization, which causes the accumulation of ions at the polymer-electrode interface [12].
The relative permittivity ([epsilon]') is mainly associated with dipole orientation, while the dielectric loss factor ([epsilon]") is a measure of the total energy lost in a dielectric material, which is influenced by both dipole motion and ion migration.
Electro-osmosis depends on the net amount of ion migration towards an electrode location, and especially in low permeability, clayey soils, the net ion migration may be high and it can significantly affect the decontamination process (Acar and Alshawabkeh 1993; Lageman 1993).
However, for CE to further mature and tackle new analytical challenges, a more fundamental understanding of the parameters affecting ion migration is essential.
A consistent physical description of the chemical/atomistic properties of materials is proposed that explains the microscopic features of forming and set and reset operations, including charge transport across hafnia, oxygen ion migration, and the shape and profile of the conductive filament.
PID is a phenomenon where leakage of electrical current from the solar cell to the panel frame drives ion migration, which modifies the electrical characteristics of the solar cell and degrades the panel's power output.