ion milling

ion milling

[′ī‚än ‚mil·iŋ]
(engineering)
References in periodicals archive ?
Tenders are invited for Precision ion milling system and other accessories for tem sample preparation
Depending on the Technology, market is segregated into Broad ion milling (BIM), Focused ion beam (FIB), Reactive ion etching (RIE), Secondary ion mass spectroscopy (SIMS), Energy dispersive X-ray spectroscopy (EDX) and Chemical mechanical planarization (CMP).
Platinum was deposited over selected areas prior to sectioning in order to save the top surface of the sample during ion milling, though this was commonly not found to be essential for sectioning the small particles.
Figure 5a shows the microstructure of HA/Ti film obtained by XTEM (dark field) prepared by ion milling.
Sela USA, Inc introduced the "Xact" system with Adaptive Ion Milling (AIM), an advanced transmission electron microscopy sample preparation system.
Bal-Tec AG's products include high-pressure and jet freezers, freeze-fracture systems, cryo transfer systems, freeze substitution systems and ion milling systems.
The approach and touchdown of the probe can be precisely controlled and, if necessary, contact points revealed by ion milling by the FIB (Figure 1).
By coating the protein layer with a thin metal film, then using a technique known as ion milling, researchers can selectively remove the metal from spots corresponding to the holes in the protein layer.
The unique capability of the Carl Zeiss CrossBeam workstation allows one to image the sample in real time at high resolution during the ion milling process, giving the operator a direct, interactive control to the ion milling process, resulting in extended accuracy on site specific cross sections.
This market covers the following equipment types: Focused Ion Beam, Broad Ion Milling, Secondary Ion Mass Spectrometry, Energy Dispersive X-Ray Spectroscopy, Reactive Ion Etching, Ion Milling, Chemical Mechanical Planarization and related equipment markets for Electron and Scanning Probe Microscopy.
An equipment for ion milling of various materials cross-sections and polishing of various materials surfaces to achieve clean and high-quality cross-sections or surfaces with minimal mechanical stress and deformation to sample for sem analysis (ebsd, Eds, Imaging).
The unique capability of CrossBeam tools to image the sample in real time at high resolution during the ion milling process gives the operator a direct interactive control to the ion mill-ing process.