ij] is the probability of latent failure
of the j-th components of the i-th subsystem; [P.
Although both scenarios can be modeled, we consider only the main failure path as represented by the Markov chain in Figure 3 where the first failure is the latent failure
and the next failure will be the primary component failure which leads to the system failure as shown by state marked "F".
Knowledge of these latent failure
types could also be used as the basis for the improvement and design of incident reporting systems.
The combination of these two factors has led to a potential latent failure
mode for thick film chip resistors, which has become more prevalent in the past five years.
can introduce new failure modes or bring into play latent failure
The goal of stress testing is to accelerate latent failure
mechanisms that would eventually lead to a device failure in the field.
The result is either immediate damage, or catastrophic failure of the device, but most often results as a latent failure
that ultimately causes the device to fail.
Consequently, product that has no new latent failure
modes should pass the screen undamaged.
If a latent failure
occurs after the product is established in its market it is still possible to judge the effect of further failures and make the appropriate decision.
is quite difficult to detect, particularly in assembled products.
Ground loops can cause latent failure
or immediate destruction of serial cards and other system components.
Semi-Markov Models: Control of Restorable Systems With Latent Failures