line defect

line defect

[′līn di‚fekt]
(crystallography)
References in periodicals archive ?
This can be exceptionally useful for production line defect analysis and process development, where time spent moving samples between tools means lost productivity and lower yield.
As if the series of incidents had not been enough, the residents of Struga were left without tap water for a few hours Tuesday as a result of a power line defect that cut the power supply to one of the pump stations.
Under careful examination, it was found that the line defect was present around the entire perimeter of the cross section, meaning that the molded microfeature is consisted of two segments (A and B in Fig.
Between March 1999 and February 2001, Polaris received nearly 1,450 reports of oil line blow-offs, disconnections and leaks resulting from the oil line defect.
Services like mapping of the pipeline, sub-meter GPS coordinates to line features and line defect areas, bend analysis for direction and angle, river crossing profiles, pipeline benchmarking for improved excavation points with anomaly locations to clock position.
In the industry, this kind of scenario plays out in real life with o-tings, such that perfectly good looking o-rings might pass through the best automated visual inspection systems available and yet have a poor knit line defect lurking just under the surface of a thin skin of rubber.
has developed a pipeline inspection tool which not only allows the user the ability to determine the size and location of anomalies, but a multitude of services like mapping of the pipeline, sub-meter GPS coordinates to line features and line defect areas, bend analysis for direction and angle, river crossing profiles, and pipeline benchmarking for improved excavation points with anomaly locations to clock position.
At [Mathematical Expression Omitted] the line defect density increases and the nematic regions are further elongated into ellipsoids.
Other built-in features include SFP-based digital diagnostics (SFF-8472), extensive optical performance monitoring and copper TDR physical line defect detection capabilities.
The MIDAS 835 Series keeps pace with many high-volume thin film and thick film manufacturing lines providing 100% fine line defect inspection down to 1-mil conductor widths on substrates up to 12 inch by 12 inch in size.
Among the other defects some of the front line defects of these NGOs are as following;
The aforementioned study is highly encouraging in taking a step toward answering the debate over the percentage of SMT line defects that stem from print defects.