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near-field scanning optical microscopy

   Also found in: Acronyms, Wikipedia 0.01 sec.
near-field scanning optical microscopy [¦nir ¦fēld ‚skan·iŋ ‚äp·tə·kəl mī′kräs·kə·pē]
(optics)
A technique for making optical measurements at dimensions much smaller than the wavelength of light, by scanning a nanometric detector or radiation source in proximity to a sample surface. Also known as scanning near-field optical microscopy.


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Next come contributions discussing confocal scanning laser microscopy, quantitative computer-assisted image analysis, laser scanning cytometry, laser capture microdissection, microarray image scanning, near-field scanning optical microscopy, atomic force microscopy, and reflection contrast microscopy.
SPM encompasses three main techniques: atomic force microscopy (AFM) (see IBO 12/31/94), scanning tunneling microscopy (STM) and near-field scanning optical microscopy (NSOM) (see IBO 5/15/05).
However, near-field scanning optical microscopy (NSOM), with its ability to generate optical micrographs with sub-diffraction limit resolution offers a means to accomplish such measurements.
 
 
 
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