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scan technology

   Also found in: Wikipedia 0.01 sec.
scan technology
A method for testing chips on the printed circuit board by building the chip with additional input and output pins that are used only for test purposes. Full scan methods test all the registers on the chip. Partial scan tests some of them, and boundary scan tests only the input/output cells. JTAG is the IEEE standard for boundary scan. See also scan rate.


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The helical scan technology helps the AIT tape format to record four times more tracks per inch.
Test Reuse A major benefit of boundary scan technology is the portability of testing and programming operations.
The technology using behavioral scan technology provides more timely protection than traditional signature-based antivirus solutions that require downloading software patches only after a new virus has been identified.
 
 
 
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