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scanning electron microscope
(redirected from scanning electron microscopes)

   Also found in: Dictionary/thesaurus, Medical 0.01 sec.
scanning electron microscope [′skan·iŋ i′lek‚trän ′mī·krə‚skōp]
(electronics)
A type of electron microscope in which a beam of electrons, a few hundred angstroms in diameter, systematically sweeps over the specimen; the intensity of secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen. Abbreviated SEM.


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He includes descriptions of conventional core analysis, special core analysis, scanning electron microscopes, and reservoir applications.
The combination of EBSD with Energy Dispersive X-Ray Spectroscopy (EDS) offers more comprehensive materials characterisation capabilities in scanning electron microscopes for a broad range of applications on metals, ceramics, and geological samples.
The Nano Technology Systems Division of Carl Zeiss SMT has introduced a new model of its SUPRA[TM] ultra high-resolution field emission scanning electron microscopes (FESEM).
 
 
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