scanning electron microscope(redirected from Scanning electron microscopy)
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Related to Scanning electron microscopy: Transmission electron microscopy
scanning electron microscope[′skan·iŋ i′lek‚trän ′mī·krə‚skōp]
A type of electron microscope in which a beam of electrons, a few hundred angstroms in diameter, systematically sweeps over the specimen; the intensity of secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen. Abbreviated SEM.