scanning electron microscope

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Related to Scanning electron microscopy: Transmission electron microscopy

scanning electron microscope

[′skan·iŋ i′lek‚trän ′mī·krə‚skōp]
(electronics)
A type of electron microscope in which a beam of electrons, a few hundred angstroms in diameter, systematically sweeps over the specimen; the intensity of secondary electrons generated at the point of impact of the beam on the specimen is measured, and the resulting signal is fed into a cathode-ray-tube display which is scanned in synchronism with the scanning of the specimen. Abbreviated SEM.
References in periodicals archive ?
Apricot (Prunus armeniaca) pollen morphological characterisation through scanning electron microscopy, using multivariate analysis.
Scanning electron microscopy (SEM) is a very useful technique to study morphology and surface microstructure of various biological specimens in three dimensions.
In preparation for scanning electron microscopy (SEM), each sample was fixed in a formaldehyde and glutaraldehyde solution.
In addition, we have scanning electron microscopy to assist in characterizing your raw materials and finished products.
The finished compacts were characterized using scanning electron microscopy and x-ray diffraction.
Field emission scanning electron microscopy (FESEM) was used to view images of surface morphology and structural information in plane view or cross section.
These include X-ray diffraction, transmitted light microscopy, reflected light microscopy, scanning electron microscopy, transmission electron microscopy, and electron microprobe.
The yield and morphology of the tubes produced by reaction with a flow of acetylene were determined by subsequent Scanning Electron Microscopy (SEM) analysis of the substrate.
SELA pioneered microcleaving technology for cross-section preparation, targeted at Scanning Electron Microscopy (SEM) analysis applications.

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