single-event upset

single-event upset

[¦siŋ·gəl i¦vent ′əp‚set]
(electronics)
A change in the state of a logic device from 0 to 1 or vice versa, as the result of the passage of a single cosmic ray.
References in periodicals archive ?
This alteration of data is called a single-event upset, or SEU.
The only way you can determine that it is a single-event upset is by eliminating all the other possible causes," (https://news.
The authors define five sources of radiation damage in Chapters 5 through 9, neutron damage (Chapter 5); ionizing radiation damage (Chapter 6); dose-rate effects (Chapter 7); single-event upset (Chapter 8); and electromagnetic pulse immediately following a nuclear bomb blast (Chapter 9).
The four major nuclear and space radiation threat categories are total dose and dose-rate effects of ionizing radiation, neutron degradation effects and single-event upset (SEU) due to protons and heavy ions.
5V -- which is about 1/10th the power of an equivalent GaAs device -- yet delivers decidedly superior rad-hard performance, including fixed divide ratio of 4; low SSB phase noise; immunity to Single Event Latchup (SEL); Single-event Upset (SEU) of less than 10E-9 errors/bit-day; and tolerance total dose radiation of 100 Krads (Si).
UltraCMOS-based products from Peregrine further offer immunity to Single Event Latchup (SEL); Single-event Upset (SEU) of less than 10E-9 errors/bit-day; and tolerance total dose radiation of 100 Krads (Si).
The new IRHY7G30SE 1000V RAD-Hard MOSFET is an enhancement-mode N-channel device, made with IR's proprietary radiation-hardened gate- and field-oxidation process to achieve stringent single-event upset and total ionizing dose hardness requirements.
The PLLs are immune to single-event latch-up (SEL), have single-event upset (SEU) of less than 10(-9) errors per bit/day, and offer total-dose radiation tolerance of 100 krad.
Based on Actel's antifuse architecture, these FPGAs will survive exposure to a maximum total dose of 300KRAD (Si), with guaranteed latch-up immunity and low single-event upset (SEU) susceptibility.
For single-event upsets (SEUs), the indications are that circuit designers will need to take account of possible spurious effects.
Several of the papers explore memory testing, automatic test pattern generation, single-event upsets, diagnosis, reconfigurable systems, and sigma- delta modulators.
The Synplify Pro software offers designers of these radiation-hardened FPGAs further improvements in single-event upsets (SEU) resistance.
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