single-event upset

single-event upset

[¦siŋ·gəl i¦vent ′əp‚set]
(electronics)
A change in the state of a logic device from 0 to 1 or vice versa, as the result of the passage of a single cosmic ray.
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5V -- which is about 1/10th the power of an equivalent GaAs device -- yet delivers decidedly superior rad-hard performance, including fixed divide ratio of 4; low SSB phase noise; immunity to Single Event Latchup (SEL); Single-event Upset (SEU) of less than 10E-9 errors/bit-day; and tolerance total dose radiation of 100 Krads (Si).
UltraCMOS-based products from Peregrine further offer immunity to Single Event Latchup (SEL); Single-event Upset (SEU) of less than 10E-9 errors/bit-day; and tolerance total dose radiation of 100 Krads (Si).
With these new capabilities, HardCopy V ASICs now support a wider range of high-volume applications which require low power, lower unit cost, or improved single-event upset (SEU) tolerance in production.
The new IRHY7G30SE 1000V RAD-Hard MOSFET is an enhancement-mode N-channel device, made with IR's proprietary radiation-hardened gate- and field-oxidation process to achieve stringent single-event upset and total ionizing dose hardness requirements.
Unburdened by the cost and schedule risks associated with radiation-hardened ASICs, the RTAX-S/SL family is the FPGA of choice for use in space-flight applications requiring built-in protection from radiation-induced single-event upset (SEU) events.
The PLLs are immune to single-event latch-up (SEL), have single-event upset (SEU) of less than 10(-9) errors per bit/day, and offer total-dose radiation tolerance of 100 krad.
Based on Actel's antifuse architecture, these FPGAs will survive exposure to a maximum total dose of 300KRAD (Si), with guaranteed latch-up immunity and low single-event upset (SEU) susceptibility.
The family, which includes the RTAX1000S used in the Phoenix mission's flight, offers unique features desirable for space-flight applications, including single-event upset (SEU)-hardened flip-flops, usable error-corrected on-board memory and a large number of user I/O.
The family offers unique features, such as Single-Event Upset (SEU)-hardened flip-flops, usable error-corrected on-board memory and a large number of user I/O, desirable for space-flight applications.
Device security encryption features for anti-tampering -- Bare die sales -- Single-event upset (SEU) detection -- Digital signal processing (DSP) performance -- Availability of reliable leaded packaging technologies
The package is hermetically sealed and complements the inherent radiation-tolerance benefits of the RTAX-S architecture, including single-event latchup (SEL) immunity; single-event upset (SEU) capability of >37MeV-cm2/mg; and total ionizing dose (TID) performance of up to 200 Krads (Si, parametric).
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