accelerated life test


Also found in: Acronyms.

accelerated life test

[ak′sel·ər‚ā·dəd ′līf ‚test]
(engineering)
Operation of a device, circuit, or system above maximum ratings to produce premature failure; used to estimate normal operating life.

accelerated life test

A test in which one or more parameters (e.g., temperature) is increased or decreased beyond its normal or rated value to determine the resulting deterioration within a reasonable time period.
References in periodicals archive ?
The results obtained in this paper show that the type-I interval censored data processing method which is applicable for censored data generated from accelerated life tests is an effective method to predict fatigue life of lead-free solder joints.
Suppose that the PQL for an accelerated life test of the VLSI circuits is given by 32 hours to failure and that the CQL is 25 hours to failure.
The basic procedure for conducting accelerated life tests consists of two parts: (1) determining median failure time at each temperature (i.e., the time required for 50% of the devices to fail); and (2) using that data to determine activation energy.
The first was a fatigue test, and the second an accelerated life test initiated under actual refrigeration conditions.
To gain optimum results from highly accelerated life test (HALT) and highly accelerated stress screen (HASS), it is important to properly plan, implement, document, and take corrective action when embarking on this path.
Abstract: Highly accelerated life test conditions do not necessarily age test articles at each experimental level at the same rate.
Contract Awarded for Used to provide electronic products to high accelerated life test (halt) with high speed screening test (hass) test when the required test environment.
The company can offer further services too, including functional testing, shake and vibration trials and a range of HALT and HASS (Highly Accelerated Life Test or Stress Screening) services.
Alta Standard provides the life-stress relationships required to analyze accelerated life test data with one or two constant stresses.
"So the person will analyze it, and they'll also do a physical accelerated life test to test the durability," Beer said.
* Real-time signal generation for long-running lifecycle tests like HALT (Highly Accelerated Life Test) and HASS (Highly Accelerated Stress Screen).
Designed to withstand an accelerated life test of 3000 hours at 150[degrees]C (the equivalent of 20-year usage), the RTE HR DIP switches feature a special whisker-free contact plating for increased reliability.
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