Auger electron


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Related to Auger electron: Auger electron spectroscopy

Auger electron

[ō′zhā i′lek‚trän]
(atomic physics)
An electron that is expelled from an atom in the Auger effect.
References in periodicals archive ?
The first commercial Auger electron spectrometers were introduced in the early 1960s and since that time, they have improved in performance, increased in size, and today can cost well over 1 million USD.
Secondary ion mass spectroscopy (SIMS) and auger electron spectroscopy (AES) applied to the fire investigation for short circuit, In Proc.
Auger electron spectroscopy (AES) is a surface sensitive analysis method for determining the elemental composition of solid materials.
Several characterization techniques including scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), and auger electron microscopy (AES) were used for the physical characterization of [Al.
The delivery system is a complete characterization of solid surfaces methods of scanning electron microscopy (SEM), Auger electron spectroscopy (AES), Scanning Auger Microscopy (SAM) and scanning electron microscopy with spin polarization detection of secondary electrons.
Of these techniques, three main instruments have evolved: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS).
The probability to have a non-radiative transition with the emission of an Auger electron is (1-[omega]).
LEED devices are often combined with other ultra high vacuum (UHV) surface science techniques, notably Auger electron spectroscopy.
Surface techniques can be of two-types: ex situ methods (where samples are removed from solution or a reaction vessel and placed in ultra-high vacuum systems), such as Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS), and in situ methods, such as infrared (IR) and Raman spectroscopy, Table 1 shows a summary of the first three techniques together with the information they provide.
Surface sensitive analytical techniques such as secondary ion mass spectroscopy, auger electron spectroscopy and x-ray photoelectron spectroscopy will always detect some degree of transfer.
used a sophisticated technique known as X-ray-excited Auger electron spectroscopy to investigate in detail the arrangement of electrons in molecules of these explosives.