Auger electron spectroscopy


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Auger electron spectroscopy

[ō′zhā i′lek‚trän spek′träs·kə·pē]
(spectroscopy)
The energy analysis of Auger electrons produced when an excited atom relaxes by a radiationless process after ionization by a high-energy electron, ion, or x-ray beam. Abbreviated AES.
References in periodicals archive ?
Auger electron spectroscopy helped in understanding the nature of these surface layers.
Yuan, "An Auger electron spectroscopy study of phosphorus and molybdenum grain boundary segregation in a2.25Cr1Mo steel," Materials Characterization, vol.
Auger electron spectroscopy data were collected on PHI 680 Auger nanoprobe equipped with a field emission electron gun and a cylindrical mirror kinetic energy analyzer.
Foulias, "Barium and oxygen interaction on the Ni(110) surface at low coverages studied by soft x-ray photoemission spectroscopy: Ba negative binding energy shifts and their correlation with Auger electron spectroscopy shifts," Journal of Physics: Condensed Matter, vol.
(4.) Sherer, J., Schnabel, P., and Childs, K., "Analysis of Sub-Micron Defects by Auger Electron Spectroscopy (AES)," in Microelectronics Failure Analysis Desk Reference, 5th Edition, Holdford, R., et al, (Ed.), ASM International, pp.
William Rogers Jr., used a sophisticated technique known as X-ray-excited Auger electron spectroscopy to investigate in detail the arrangement of electrons in molecules of these explosives.
Upcoming articles will detail Auger electron spectroscopy (AES) and secondary ion mass spectrometry (SIMS).
Surface analyzers consist of dynamic SIMS (D-SIMS), time-of-flight SIMS (TOF-SIMS), Auger Electron Spectroscopy (AES) and electron spectroscopy for chemical analysis (ESCA).
Using Auger electron spectroscopy, it has been shown that PC is completely removed from the inside of the holes.
Surface techniques can be of two-types: ex situ methods (where samples are removed from solution or a reaction vessel and placed in ultra-high vacuum systems), such as Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS), and in situ methods, such as infrared (IR) and Raman spectroscopy, Table 1 shows a summary of the first three techniques together with the information they provide.
Surface sensitive analytical techniques such as secondary ion mass spectroscopy, auger electron spectroscopy and x-ray photoelectron spectroscopy will always detect some degree of transfer.