Inherent variances are due to DUT
cable positioning and orientation, coupling to chamber or test cell structure and (for mains-powered DUTs
) local mains supply impedances and imbalances.
These rotation angles as seen from the point of view of the DUT
are given by [[theta].sub.s] = -[[theta]'.sub.x].
The coupling between the probe and the DUT
can change when the distance is altered or the probe vibrates.
The total capacitance added into the DUT
model gives [C.sub.DUT].
* [k.sub.2Std] and [k.sub.2DUT] are some unknown terms related to the leakage of cable and connector, drift, linearity and frequency error when the reference standard and the DUT
are connected to port 2,
The fabricator has to worry about tight impedance control, and because of the DUT
package, these boards will often have blind and filled vias.
The four-wire DUT
connections of the improved method are desirable because they eliminate voltage errors due to measurement lead and contact resistance.
The losses in this approach can be extracted and optimized based on the information from the signal's rise time degradation and on the slope of the TDR voltage in the DUT
Specification based verification Task Specifications Generating input stimuli DUT
specifications Writing tests Test plan Protocol checking DUT
specifications or standard bus specifications Coverage Coverage plan Table 2.
It is possible to measure the system noise floor and determine how close it is to the DUT
noise floor, and the resulting error can be calculated.
Strain surveys for rotating parts are considerably more difficult due to the very high "g" loads involved on both the device under test (DUT
) and the instrumentation.
CM2 also performs device under test (DUT
) management functions, such as informing the operator of DUTs
that are due for calibration based on user-defined calibration intervals.