magnetic force microscopy


Also found in: Acronyms.

magnetic force microscopy

[mag¦ned·ik ¦fȯrs mī′krä·skə·pē]
(engineering)
The use of an atomic force microscope to measure the gradient of a magnetic field acting on a tip made of a magnetic material, by monitoring the shift of the natural frequency of the cantilever due to the magnetic force as the tip is scanned over the sample.
References in periodicals archive ?
In the past decade, magnetic force microscopy (MFM) has found numerous applications in the study of magnetic materials.
Applications include magnetic force microscopy (MFM), conductance and other situations where the sample depends on the applied field.
Industrial-imaging applications include evaluating microcracks in silicon, determining the 3-D fields around magnetic recording heads, and characterizing tip fields used in magnetic force microscopy.