SIMS

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SIMS

[simz]
References in periodicals archive ?
Boone et al., "Consequences of decontamination procedures in forensic hair analysis using metal-assisted secondary ion mass spectrometry analysis," Analytical Chemistry, vol.
[4.] TOF-SIMS V from IONTOF GmbH (Munster, Germany), TOF-SIMS: time of flight secondary ion mass spectrometry.
The topics include time-of-flight secondary ion mass spectrometry, synchrotron-based techniques, in-depth analysis and profiling, characterizing nanostructured materials, problem-solving methods in metallurgy with surface analysis, composites, the surface analysis of biomaterials, and electron spectroscopy in corrosion science.
Another surface analysis technique, ToFSIMS (Time of Flight Secondary Ion Mass Spectrometry) can provide even more detailed molecular information from the outer 1-2 nanometres of the surface of the product.
Hiden Analytical announces the introduction of a complete, compact SIMS (Secondary Ion Mass Spectrometry) facility conveniently mounted on a single UHV Conflat-type flange.
Secondary ion mass spectrometry (SIMS) is an important surface science technique that provides very high sensitivity for the detection of trace elements in solid samples, while also providing good spatial detail.
The analysis of diagnostic markers of genetic disorders in human blood and urine using tandem mass spectrometry with liquid secondary ion mass spectrometry. International Journal of Mass Spectrometry, v.111, p.211-228, 1991.
From here we can decide if the use of surface sensitive techniques like infrared spectroscopy (IR), x-ray photoelectron spectroscopy (XPS) or secondary ion mass spectrometry (SIMS) is appropriate.
They will also be presented at the following two occasions: the 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) to be held in Manchester, UK, from September 12 to 16, and Cosmetics 2005 International Conference-World Wide Wellness to be held in Florence, Italy from September 19 to 21.
This was achieved by characterizing the surface and the bulk (cross section) of moldings manufactured with a high-flow grade and a low-flow grade of commercial polystyrene by the time-of-flight secondary ion mass spectrometry (TOF-SIMS) analytical technique.
Secondary ion mass spectrometry (SIMS) experiments have well established that polyatomic projectiles have the potential to greatly increase the sensitivity of static SIMS.
G Owens, Investigations of matrix-assisted laser desorption/ionization sample preparation by time-of-flight secondary ion mass spectrometry, J.

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