x-ray photoelectron spectroscopy


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Related to x-ray photoelectron spectroscopy: Raman spectroscopy, Auger electron spectroscopy

x-ray photoelectron spectroscopy

[′eks ‚rā ¦fōd·ō·i¦lek‚trän spek′träs·kə·pē]
(spectroscopy)
A form of electron spectroscopy in which a sample is irradiated with a beam of monochromatic x-rays and the energies of the resulting photoelectrons are measured. Abbreviated XPS. Also known as electron spectroscopy for chemical analysis (ESCA).
References in periodicals archive ?
The X-ray photoelectron spectroscopy analysis of raw oil shale samples and the obtained semi-cokes was performed on a Thermo VG Scientific ESCALAB 250 Xi spectrometer, which was equipped with a microfocusing monochromator and a charge compensation system.
X-ray Photoelectron Spectroscopy detects elements with atomic number of 3 and above only.
X-ray photoelectron spectroscopy (XPS) was also used to characterize the top 10 nm of the surface of the rubber.
Non-traditional techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, Mossbauer spectroscopy, and cathodoluminescence microscopy, are also beneficial in determining mineralogical interactions of processed materials.
Treated and untreated surfaces were analyzed using X-ray photoelectron spectroscopy (XPS).
Tenders are invited for Surface Analysis Instrumentation Partnership including X-ray Photoelectron Spectroscopy (XPS), Scanning Auger Microscope/Auger Electron Spectroscopy (SAM/AES) and Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS).
The second volume is devoted to experimental techniques for investigating characteristics of biopolymers, such as X-ray photoelectron spectroscopy, the large-scale structural characterization of biopolymer systems by small-angle neutron scattering, and the aging and biodegradation of biocomposites.
Presentation topics will include: Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy (XPS), Chemical Imaging by Secondary Ion Mass Spectrometry (ToFSIMS), Chemical Characterisation of Layer Structure and Buried Interfaces by Dynamic Secondary Ion Mass Spectrometry (DSIMS), and Quantification of Surface Topography and Layer Thickness Measurement.
The surface structure and chemistry were studied in terms of electron diffraction spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) and the physical properties of deposited gallium nitride crystal were studied in terms of X-ray diffraction spectroscopy (XRD).
NEW TECHNOLOGY Prof Peter Cumpson with Newcastle University nanoLab's new X-ray Photoelectron Spectroscopy (XPS)