x-ray photoelectron spectroscopy


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Related to x-ray photoelectron spectroscopy: Raman spectroscopy, Auger electron spectroscopy

x-ray photoelectron spectroscopy

[′eks ‚rā ¦fōd·ō·i¦lek‚trän spek′träs·kə·pē]
(spectroscopy)
A form of electron spectroscopy in which a sample is irradiated with a beam of monochromatic x-rays and the energies of the resulting photoelectrons are measured. Abbreviated XPS. Also known as electron spectroscopy for chemical analysis (ESCA).
References in periodicals archive ?
Fischer, "NIST high throughput variable kinetic energy hard X-ray photoelectron spectroscopy facility," Journal of Electron Spectroscopy and Related Phenomena, vol.
The X-ray photoelectron spectroscopy analysis of raw oil shale samples and the obtained semi-cokes was performed on a Thermo VG Scientific ESCALAB 250 Xi spectrometer, which was equipped with a microfocusing monochromator and a charge compensation system.
X-ray Photoelectron Spectroscopy technique studies the surface sample without destroying the surface.
X-ray photoelectron spectroscopy was used to measure the density of amino groups attached to slide surfaces.
Moreover, an interaction between nitrogen of amides moieties of nylon-6,6 and silver nanoparticles has been found by X-ray photoelectron spectroscopy.
X-ray photoelectron spectroscopy (XPS) analysis was performed in VG Microtech ESCA 2000 UHV surface analysis system.
Current instrumentation in the x-ray photoelectron spectroscopy (XPS) field allows only fir the analysis of solid substances.
Identification of the contaminant usually requires analysis of individual craters by sophisticated instruments such as scanning electron microscopy, infrared microscopy, x-ray photoelectron spectroscopy (XPS or ESCA), and secondary ion mass spectrometry (SIMS).
With present work, we carry out a further study on the some macroscopic observation, composition and microstructures of primary melted marks (PMM) and secondary melted marks (SMM) by video microscopes, X-ray photoelectron spectroscopy (XPS) and optical microscopes.
X-ray photoelectron spectroscopy revealed traces of chlorine on the ITO surface.
X-ray photoelectron spectroscopy (XPS) was carried out using Escalab 220 XL spectrometer from Vacuum Generators.