acoustic microscope


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Related to acoustic microscope: electron microscope, acoustic lens

acoustic microscope

[ə′küs·tik ′mīk·rə‚skōp]
(optics)
An instrument which employs acoustic radiation at microwave frequencies to allow visualization of the microscopic detail exhibited in elastic properties of an object.
References in periodicals archive ?
These and other details made the development of tool matching for acoustic microscopes a challenging business.
On the other hand, large subsurface defects could be observed by acoustic microscope at these samples.
Those samples were measured with the scanning acoustic microscope Sonix HS-1000 using a 50 MHz focused lens with an aperture of 12[degrees] (Fig.
It is worth noting that the ultrasound pulsed into a sample by the scanning transducer of an acoustic microscope is reflected only from the material interfaces inside the sample.
After conditioning, the parts were subjected to three lead-free reflows with a peak temperature of 260[degrees]C (Figure 4) and imaged again using the acoustic microscope.
For any acoustic microscope application, the return echoes typically are gated on a particular depth of interest, meaning that echoes arriving before or after the gated time are ignored.
The recently developed scanning laser acoustic microscope (SLAM), which finds applications as a nondestructive testing technique, is applied here to measure the acoustic attenuation changes during water sorption of crosslinked poly(HEMA) films.
An acoustic microscope allows you to see through structures that are not optically transparent," says Anita Rohm, head of product development at Leica Mikroskopie and Systeme GmbH, Wetzlar.
will install a scanning acoustic microscope (SAM), for use in wafer bonding analysis.
Customers of Palomar's Process Development and Prototyping Services can now use the Sonix UHR-2001 scanning acoustic microscope to measure the voiding in eutectic and epoxy die attach and improve their manufacturing processes.
e a Tofsims system (IonTOF) with build-in Scanning Probe stage and FIB column for true 3D-composition profiling, a completely automated micro-Hall and sheet resistance measurement tool (Capres) with additional capabilities for measurements on dedicated test structures (prior to full BEOL) and an GHz acoustic Microscope (Tepla) for probing voids in TSVs and stacked dies.
Calvin Quate is a legendary professor at Stanford University who has made many contributions in the field of microscopy such as the acoustic microscope and the atomic force microscope.

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