atomic force microscope


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Related to atomic force microscope: scanning electron microscope

atomic force microscope

(AFM), device that uses a spring-mounted probe to image individual atoms on the surface of a material, first developed by Gerd BinnigBinnig, Gerd
, 1947–, German physicist, Ph.D. Univ. of Frankfurt, 1978. At the IBM Research Laboratory in Zürich, Binnig and fellow researcher Heinrich Rohrer built the first scanning tunneling microscope, an instrument so sensitive that it can distinguish individual
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 in 1986. Unlike the scanning tunneling microscopescanning tunneling microscope
(STM), device for studying and imaging individual atoms on the surfaces of materials. The instrument was invented in the early 1980s by Gerd Binnig and Heinrich Rohrer, who were awarded the 1986 Nobel prize in physics for their work.
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, which is also a scanning probe microscope, the AFM can be used on materials that do not conduct electricity. In the original AFM, the probe traverses the surface, moving upward due to bumps and downward due to depressions; a laserlaser
[acronym for light amplification by stimulated emission of radiation], device for the creation, amplification, and transmission of a narrow, intense beam of coherent light. The laser is sometimes referred to as an optical maser.
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 beam reflected from the tip of the probe measures the up and down movements, and the pattern of reflected light creates an image of the surface. Another type of AFM measures the sideways deflection of the tip caused by friction as the probe moves across the surface; differences in friction can be used distinguish different atoms and molecules on the material. A third variation employs a magnetic probe; this probe does not touch the material but moves up and down in reaction to the magnetic forces between the tip and the surface. In a microchip-size AFM, the electronic circuitry and multiple probes are integrated on a sliver of silicon; although less sensitive than a full-size AFM, the device has applications in microelectronicsmicroelectronics,
branch of electronic technology devoted to the design and development of extremely small electronic devices that consume very little electric power. Although the term is sometimes used to describe discrete electronic components assembled in an extremely small
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 where the multiple probes make it possible to record images very quickly.

atomic force microscope

[ə¦täm·ik ¦fȯrs ′mī¦krə‚skōp]
(engineering)
A device for mapping surface atomic structure by measuring the force acting on the tip of a sharply pointed wire or other object that is moved over the surface.
References in periodicals archive ?
Although the scanning electron microscope was able to show virus particles in the process of extruding (Figure 2B, Figure 3A and B) from the cells, the image derived with the atomic force microscope was superior in resolution.
In this lawsuit, Veeco alleges that the manufacture, use and sale of Asylum's MFP-3D atomic force microscope constitutes willful infringement of five Veeco patents, including the U.
Like a record needle, the sharp probe of an atomic force microscope (AFM) scans the surface of a material, tracing out the hills and valleys of the molecular landscape.
Atomic force microscope (AFM) has become a well-established technique for imaging single biomolecules under physiological conditions.
Tenders are invited for Supply of Atomic Force Microscope
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Contract award notice: Delivery atomic force microscope Bioscope Resolve scanning head MultiMode8 lockout Specs for the Institute of Biotechnology of the University of Gdansk.
The innovators start from Rohrer and Binnig's basic concepts, now embodied in the two main types of scanning probe microscopes: the STM and the atomic force microscope (AFM).
LittleFoot(TM) is completely self-contained (no added modules are necessary), and will accomplish all these measurements simultaneously, with excellent correlation to CD Scanning Electron Microscope (CD-SEM) and Atomic Force Microscope (AFM) results.
Contract notice: Acquiring atomic force microscope (afm).
Removed from the solution, dried, and examined with an atomic force microscope, the crystals look like striped sheets.
UCL would like to invite suppliers to submit bids for supply of an Atomic Force Microscope.