automatic test equipment

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automatic test equipment

[¦ȯd·ə¦mad·ik ′test i‚kwip·mənt]

(engineering)

Test equipment that makes two or more tests in sequence without manual intervention; it usually stops when the first out-of-tolerance value is detected.

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The European electronic manufacturing industry is witnessing a rise in demand for printed circuit board (PCB) automatic test equipment (ATE) to identify defects in electronic assemblies.

European Printed Circuit Board Automatic Test Equipment Market: Demand For Advanced Packaging And Interconnect Technologies Is Likely To Intensify

Teradyne (NYSE: TER) is a leading supplier of Automatic Test Equipment.

Boston-Based Teradyne, Inc. Chooses ZOLL Defibrillators for Global Early Defibrillation Program

Efficient testing of nanometer devices requires proven links between Automatic Test Equipment (ATE) and Automatic Test Program Generation (ATPG).

Teradyne and Cadence Address Improved Test and Diagnostic Flow for Nanometer Devices

NYSE:TER) and Salland Engineering, of The Netherlands, have developed the automatic test equipment (ATE) industry's first fully-integrated, universal slot, open architecture test solution.

Teradyne Announces ATE Industry's First Universal Slot Open Architecture Solution

The global semiconductor automatic test equipment (ATE) market continuously evolves to meet end-user demands in terms of performance and applications.

Cost of Testing is the Key Issue as Market Deals with Complex Electronic Equipment

AWR(R)), a leading provider of high-frequency electronic design automation (EDA) tools, today announced that it has signed an agreement to provide Microwave Office(R) design suite to Eagle Test Systems (Eagle), a supplier of automatic test equipment (ATE) for the world's leading semiconductor companies.

AWR's Microwave Office Design Suite Selected by Eagle Test Systems; AWR's High-Frequency Software Outperforms Competition in Solving Complex Design Problem

Tools Speed Failure Analysis by Automating Information Sharing between Electronic Design Automation and Automatic Test Equipment

Agilent Technologies and Synopsys Announce Industry-First Scan Diagnostics Reference Methodology

To maintain high fault coverage on large designs, a proportionately large number of scan-chains are required, resulting in high pin counts for scan testing and high costs for load boards for testing on Automatic Test Equipment (ATE).

ChipX Selects SynTest's VirtualScan -- Scan/ATPG Tool to Reduce Test Costs for Next Generation Large ASICs