crystal defect

crystal defect

[′krist·əl ′dē‚fekt]
(crystallography)
Any departure from crystal symmetry caused by free surfaces, disorder, impurities, vacancies and interstitials, dislocations, lattice vibrations, and grain boundaries. Also known as lattice defect.
References in periodicals archive ?
SDK's SiC epitaxial wafer business is rated by power semiconductor manufacturers for the lowest incidence of crystal defect and the highest wafer homogeneity in the world.
In the recrystallization process, the residual solvents and bubbles are easily trapped in the crystal to form the crystal defect, which can increase the SSA of HNS particles.
Conventional LEDs based on foreign substrates like sapphire, silicon carbide, or silicon do have limited reliable operating regimes (typically only up to 85[degrees]C) because of their high crystal defect densities."
Claus, "Analysis of one-dimensional photonic band gap structures with a liquid crystal defect towards development of fiber-optic tunable wavelength filters," Optics Express, Vol.
FDTD analysis of photonic crystal defect layers filled with liquid crystals // Optical and Quantum Electronics, 2005.--Vol.
(2) XRD patterns show that sodium doping led to crystal defect that could make absorption reactivity increase.
However, fine particles of titanium oxide often develop crystal defect, resulting in lower efficiency in the use of light and lower photocatalytic activity.
These wafers, with high surface smoothness and low crystal defect, are being produced at SDK's Chichibu Plant in Saitama Prefecture.
Atomic defects in materials such as diamond are one such system, but a lack of techniques for fabricating and engineering crystal defects at the atomic scale has limited progress to date.
The phenol would be photocatalyzed because more naked Zn atoms on the crystal defects bind O atoms of phenol molecules.
For instance, although a method known as electron-beam induced current, which analyzes samples using the beam of an electron microscope, provides data on nanoscale variations in solar cell efficiency, it gives little information on the underlying crystal defects and impurities that degrade efficiency.
As MOSFET's oxide film, formed on the surface of an epitaxial wafer, is used in device operations, finer surface defect (SD) and various types of crystal defects, including basal plane dislocation (BPD), considerably affect the yield and product quality.