The palygorskite with the characteristic reflections appeared at 20 = 8.41[degrees] (d = 1.0503 nm, 110 crystal plane
), 20 = 13.72[degrees] (d = 0.6453 nm, 200 crystal plane
), 2[theta] = 16.37[degrees] (d = 0.5412 nm, 130 crystal plane
), and 20 = 19.81[degrees] (d = 0.4482 nm, 400 crystal plane
The pole figures of (200) crystal plane
obtained from 2D WAXD, as shown in Fig.
We assume that such Pb[I.sub.2] microcrystals or NCLs are formed in Cd[I.sub.2] of 2H or 12R polytypes because they have an analogous peak related to this crystal plane
. For 2H Pb[I.sub.2] the observed intense peak can be associated with (011) plane and other observed peaks of low intensity are related to the (012), (110), and (104) planes.
Increasing the number of Pb atoms in the bath causes the basal crystal plane
to tilt , thus leading to various zinc surface coating types.
Compared with the untreated wood sample, the X-ray diffraction peak position of the thermally treated eucalyptus wood migrated slightly to the left; the distance between the crystal plane
might have increased.
Calcite's main diffraction angle position 2[theta] of 23.0[degrees], 29.4[degrees], 35.9[degrees], 39.5[degrees], 43.1[degrees], 47.5[degrees], and 48.5[degrees] was approximately was approximately corresponding to (012), (104), (110), (113), (202), (018), and (116) crystal plane
, respectively, and the vaterite diffraction angle position 2[theta] of 21.0[degrees], 32.7[degrees], 43.8[degrees], and 49.0[degrees] was approximately corresponding to (002), (102), (110), and (104) crystal plane
, respectively (Figure 3).
It may also suggest that the crystal plane
in which the wax is then oriented is the plane most effective at resisting abrasion.
The ZnO sample exposed crystal plane
was controllable when it was fabricated by pulsed laser deposition (PLD) via selecting the proper substrate [12-15].
When the Bragg equation is satisfied, the angle formed by the diffracted beam with the crystal plane
is equal to the one between by the incident beam and the same crystal plane
There is also active research underway on how changes in the crystal plane
of substrate surfaces can increase on-current, as electrical characteristics of a substrate surface change depending on which crystal plane
of silicon is applied to a substrate surface.
Numerous microscope attachments were developed for the measurements of plane angles, i.e., the angle formed by two crystal edges of a horizontal crystal plane
, and for determining the angles of very small crystals.
The X-ray diffraction pattern may show no peaks at all in the whole scanning range when the deviation angle between the crystal plane
and the sample surface is relatively large, making it difficult to assess the actual crystal orientation in such a case.