"The TSP architecture allows us to create a test system, whether it's the simplest little curve tracer
on the bench for doing just initial device evaluation or a full-blown production parametric process-monitor system," Stauffer said.
has introduced the new CTR-101 Curve Tracer
. A curve tracer
is a traditional tool used in industry and university labs to visualize the operation and behavior of semiconductor devices.
The pin--to-pin I-V characteristics for the failed and good transistors were confirmed with a curve tracer
. The good and failed transistors were soldered upside down (based on the components' wire-bonding, which was bottom-side, per Figure 1) onto HASL-coated copper coupons.
This can be accomplished if the sweep rate of the curve tracer
is low enough that the dwell time in each measurement region is sufficiently higher than the time constant of the effect.
Facilities The centre has a fully equipped power electronics laboratory, with general-purpose test and development equipment a high power curve tracer
, thermal device characterisation equipment and device characterisation equipment.
When a project requires a long arc, draw it quickly on the workpiece with a homemade curve tracer
. It's a 3- to 5-ft.
The operation of a curve tracer
, an instrument used to measure the dc parameters of transistors, diodes, and linear ICs and other semiconductor devices, is based on applying step increments of current or voltage to the device and plotting the result of these incremental changes at the output.
Yokogawa offers its Model 765670 Curve Tracer
Software, which is a high-speed, high-accuracy real-time I/V curve tracer
that works with the GS Series SMUs.
For example, someone could start with an entry level Parametric Curve Tracer
, then add the capabilities of additional System SourceMeter instruments, such as higher voltage and/or higher current, at a later date.
The curve tracer
simulation of Figure 3 indicates how the safe operating area extends as the E-B short might be placed to improve the SOA as sketched.
The results from this system were checked against a semiconductor analyzer and a curve tracer
using the smaller and larger devices, respectively.