defect density


Also found in: Acronyms.

defect density

(programming)
The ratio of the number of defects to program length.
References in periodicals archive ?
To prevent deterioration in the production yield of such large chips, the defect density on the surface of epitaxial wafers should be controlled to be less than 0.1/cm2.
We also had to introduce a variation in the bulk defect density to allow for a better fit.
The improved photovoltaic performance of DSSCs can be attributed to the following facts: (i) an energy barrier is formed at the Ti[O.sub.2]/electrolyte interface to reduce the electron back recombination [3, 4, 6-10]; (ii) the longer ZnO nanorods provide larger surface area for more dye adsorption; and (iii) the lower defect density in longer ZnO nanorods favors more efficient electron transport in the nanorods.
Numerical simulation has been performed on the defect density at both interfaces from 1 x [10.sub.10] [cm.sup.-3] to 1 x [10.sup.16] [cm.sup.-3].
Regarding crustal rock as a critical state percolation lattice, rock in the ductile lower crustal represents the rock state with defect density below the percolation threshold, and rock in the cohesionless uppermost-crust represents the rock state with defect density above the percolation threshold.
Using the HGE technology, SDK has also succeeded in producing SiC epitaxial wafers with film thickness of 100um or more, having low levels of defect density and good uniformity.
* Defect density (defects per 1,000 lines of code) of open source code and commercial code has continued to improve since 2013:
The corresponding defect density profile results in a force that may induce strain field in medium.
So the size of particular module may affect the defect density. Ferdinand [10] study argued that a number of defects are increased with number n of the code segment.
Since 2006, Python has achieved a defect density of .005 (or .005 defects per 1,000 lines of code) and has eliminated all high-risk defects in its codebase.
Defect density: In the prior theoretical description of multiple inspection behavior, it was assumed the values of the miss rate or false alarm rate were unrelated to the fraction defective.