Most load current is shifted to expand the depletion layer
. The MOS channel current is small, so the gate has limited control over di/dt.
A negative gate potential [V.sub.GS] is applied to the bottom side of the p-type silicon substrate such that a negatively charged depletion layer
appears under the buried oxide layer.
Similarly the boundary conditions for time varying normalized current density (P(x,t) = ([J.sub.p](x,t) - [J.sub.n](x,t))/[J.sub.t](t)) at the depletion layer
edges (i.e., at x = 0 and x = W) are given by
If the thickness of Sn[O.sub.2] sample decreases, the ratio of the thickness of depletion layer
and thickness of the sample increases; the sample of Sn[O.sub.2] thin layer can be depleted as a whole and the conductance of the sample is small [22, 29].
The higher result obtained for n-Sn[O.sub.2]/Si[O.sub.2]/n-Si device related to the increase in the depletion layer
width by adding the interfacial oxide thickness (Si[O.sub.2]) which means large area for electron-hole pairs separation and hence large photo-current.
First, it is clear that for high reverse gate-channel bias, the depletion layer
extends over most of the channel.
They can be attributed to the immobile (chemisorbed) and mobile (physisorbed) water molecules layer formation on the nanowire surface, which locally change the height of the Schottky barrier and depletion layer
Here the zero bias depletion layer
formed under the metal acts as the topmost lossless layer.
Engineers who never had been quite certain of how the incident wave propagates across the MESFET gate strip, or the direction electrons flow in the presence of an electron depletion layer
will find the diagrams depicting the physical functioning of solid-state circuit elements, most enlightening.
And thus, as mentioned earlier, in a [Cu.sub.2]O absorber of thickness of <3 [micro]m, a full built-in bias is not formed due to an inadequate depletion layer
As shown in Figure 5, after decorating the NiO NSs with ZnO NRs, the conductance was decreased due to the formation of local electron depletion layers
at the heterojunctions between p-type NiO and n-type ZnO.