depletion-layer capacitance

depletion-layer capacitance

[di′plē·shən ‚lā·ər kə′pas·əd·əns]
(electronics)
References in periodicals archive ?
According to Figure 3, the density of interface traps per area and energy ([D.sub.it]) can be determined from the subthreshold swing measurement, because [S.sub.t] is expressed as 2.3(kT/q)[1 + ([C.sub.D] + [C.sub.it])/[C.sub.ox]] [12], where [C.sub.D] is the depletion-layer capacitance, [C.sub.it] is the capacitance associated with the interface traps, and [C.sub.ox] is the dielectric capacitance.