Their topics include the composite scattering and Doppler spectra of a moving ship at a time-evolving sea surface, volume integral equation solvers for

electromagnetic scattering by penetrable objects, analytical formulations of scattering by finite circular cylinder and thin dielectric circular disk, electromagnetic wave scattering in dense media: applications in the remote sensing of sea ice and vegetation, and target feature extraction with polarimetric radar.

Guo, "Fractal characteristics investigation on

electromagnetic scattering from 2-D Weierstrass fractal dielectric rough surface", Chinese Physics B, vol.

In theory, this mutual coupling effect can be understood as the problem of

electromagnetic scattering in the metal nanostructures.

Award Notice: Conduct research in antenna technology, opto-electric technology,

electromagnetic scattering, and infrared sensor technology.

Strohbehn, "Coupling of finite element and moment methods for

electromagnetic scattering from inhomogeneous objects," IEEE Transactions on Antennas and Propagation, Vol.

In the optical region, the

electromagnetic scattering characteristics of a radar target can be regarded as coherent syntheses of

electromagnetic scattering sources in several local positions.

The wideband radar echo of micro-motion target contains

electromagnetic scattering property, geometry property and motion characteristic, which provides important evidence for radar target identification [3].

Mishchenko, MI, "Gustave Mie and the Fundamental Concept of

Electromagnetic Scattering by Particles: A Perspective.

The linear sampling method in inverse

electromagnetic scattering.

This work details the theory, methods, and calculations needed to explain the

electromagnetic scattering of electrons and positrons and the emission and absorption of photons.

Three-dimensional modeling of

electromagnetic scattering and radiation is described and large-scale finite element scattering analysis on massively parallel computers is explained.

Neureuther's research includes models for chemically amplified imaging materials (STORM); simulation of optical, electron, ion beam and x-ray lithography (SAMPLE); assessment of residual effects of defects and lens aberrations (SPLAT);

electromagnetic scattering (TEMPEST); time-evolution of topography (SAMPLE3), fast-CAD kernel convolution with layout (Pattern Matcher); environments for integrating simulators with process flow (SIMPL, PROSE); and remote web-based simulation (LAVA).