electron spectroscopy


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electron spectroscopy

[i′lek‚trän spek′träs·kə·pē]
(spectroscopy)
The study of the energy spectra of photoelectrons or Auger electrons emitted from a substance upon bombardment by electromagnetic radiation, electrons, or ions; used to investigate atomic, molecular, or solid-state structure, and in chemical analysis.
References in periodicals archive ?
Single electron transistors is used in both analog and digital domains such as ultra-sensitive microwave detectors, infrared radiation detection, single electron spectroscopy, and ultrasensitive microwave detector.
The chemical elements as a function of depth after maraging were analyzed by Auger Electron Spectroscopy (AES) to investigate the reasons for the coloration of the surf aces of the samples.
He discusses molecular structure and electronic structure, including x-ray and electron spectroscopy methods; the crystallographic structure and microstructure determination, including diffraction, reflectometry, and scattering; the imaging and other real space mapping methods based on x-rays; the anomalous dispersion of chemical elements and uses in elemental, chemical, and orbital x-ray contrast variation; the surface and bulk sensitivity of the methods; organic and bio-organic samples; x-ray electrochemical case studies of batteries, fuel cells, and photoelectrochemical cells; and how x-ray based data can match the conductivity data from some materials.
Auger electron spectroscopy (AES) has been widely used in the investigation of carbon bonds in carbon based materials thin films because the main peak of the carbon Auger transition involves valence states [4-13].
The treated surface was characterized using water contact angle measurement for surface energy, optical profilometry for surface roughness, SEM for surface features and Auger electron spectroscopy for chemical analysis of surface.
Valley Cottage, NY, June 21, 2015 --(PR.com)-- X-ray Photoelectron Spectroscopy (XPS) is also known as Electron Spectroscopy for Chemical Analysis (ESCA).
Professor Rik Brydson, from the school of chemical and process engineering at the University of Leeds and chairman of the SuperStem advisory consortium, explains that this increase in energy resolution for spatially resolved electron spectroscopy in the microscope produces an order of magnitude of 10 times improvement.
The surface of the CVD graphene was characterized by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy.
Auger electron spectroscopy (AES) is one of the most fundamental techniques in surface science providing chemical, growth mode, and coverage information [1, 2].
For the analysis of electrochemically deposited Se layers, auger electron spectroscopy (AES) was measured (JAMP-9500F, JEOL).

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