electron spectroscopy


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electron spectroscopy

[i′lek‚trän spek′träs·kə·pē]
(spectroscopy)
The study of the energy spectra of photoelectrons or Auger electrons emitted from a substance upon bombardment by electromagnetic radiation, electrons, or ions; used to investigate atomic, molecular, or solid-state structure, and in chemical analysis.
References in periodicals archive ?
com)-- X-ray Photoelectron Spectroscopy (XPS) is also known as Electron Spectroscopy for Chemical Analysis (ESCA).
The Board of Trustees of the University of Illinois on behalf of the Nuclear, Plasma, and Radiological Engineering Department are seeking a High-Pressure Electron Energy Analyzer System to perform X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), and Low-Energy Ion Scattering Spectroscopy (LEISS) in a custom designed vacuum facility operating at pressures in the mtorr range at its location in Urbana-Champaign.
The surface of the CVD graphene was characterized by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy.
This article provides an overview of the Auger electron spectroscopy technique and includes examples of its use for studying coatings.
The book begins with an overview of materials technology applications in radiofrequency and microwave circuits, then presents studies on specific topics such as design of a multichannel integrated biosensor chip, microelectronic systems for extracellular neural recording, and electron spectroscopy and near infrared photocurrent measurement of working organic thin film FETs.
Other methods such as optical emission spectroscopy (OES), energy-dispersive x-ray spectroscopy (EDS), x-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) can also help identify solder compositions.
These findings were published in the June 2005 issue of the Journal of Electron Spectroscopy and Related Phenomena.
Electron spectroscopy for chemical analysis (ESCA) is one of several closely related surface analysis techniques that can be used to probe the atomic and chemical composition of surfaces.
The highest sensitivity to B is in the low energy part of the spectrum where the electron spectroscopy is more difficult because of background and threshold effects.
Scanning electron microscopy (SEM) and electron spectroscopy for chemical analysis (ESCA) were employed to interpret the interactions between polymer molecules and rosin size particles.
Non-traditional techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, Mossbauer spectroscopy, and cathodoluminescence microscopy, are also beneficial in determining mineralogical interactions of processed materials.
Surface analysis by Electron Spectroscopy for Chemical Analysis (E.

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