ellipsometer

ellipsometer

[ə‚lip′säm·əd·ər]
(optics)
An instrument for determining the degree of ellipticity of polarized light; used to measure the thickness of very thin transparent films by observing light reflected from the film.
References in periodicals archive ?
Contract notice: Provision Of A Spectroscopic Ellipsometer
A spectroscopic ellipsometer is a high-precision and non-contacts measurement instrument that uses changes in the polarization of light to measure the thickness and optical coefficients (refractive index and extinction coefficient) of a transparent or semi-transparent thin film.
ULVAC also releases, the "UNECS-3000A", an automatic high-speed spectroscopic ellipsometer which can measure the thickness of a thin film, as well as, optical constant.
Ellipsometric analyses were done by using a Gaertner ellipsometer L116S, equipped with an HeNe laser ([lambda]=632.
nano size) might be used with an ellipsometer to determine of the RI of these particles.
Standards were measured using the contact profilmeters, atomic force microscope, interference microscope, ellipsometer and scanning tunneling microscope (STM).
The thicknesses of the coatings were obtained using a VASE spectroscopic ellipsometer (SE, J A Woollam Inc.
Using ellipsometer thickness of PVP and Ag/PVP thin layers formed on Si plate were measured, and only approximate results obtained: thickness range of both layers were 0.
Reproducibility in the coating thickness on the glass plates or on witness plates was achieved by monitoring with a 3-wavelength (HeNe) ellipsometer (AutoEL[R]-III Automatic Ellipsometer; Rudolph Research) and was critically dependent on having a contamination-free glass surface.
The thickness of the photoresist layers and the adsorption of the surfactant were measured in situ using a null ellipsometer in a polarizer-compensator-sample-analyzer arrangement (Multiskop, Optrel Berlin) with a He-Ne laser light source of 632.
All measurements were performed with a Rudolph 436 thin film ellipsometer at 401 nm.