Refractive index measurements were performed on a UVISEL ellipsometer
(Jobin Yvon S.
Tenders are invited for Supply And Installation Of Spectroscopic Ellipsometer
(UVISEL-NIR, Horiba JobinYvon) was used to measure the film thickness.
The prepared thin films had thickness in the range of 15 to 20 nm as measured on an ellipsometer
These films are RF magnetron sputtered-deposited onto glass substrates and are characterized with the use of XRD and Spectroscopic Ellipsometer
A spectroscopic ellipsometer
is a high-precision and non-contacts measurement instrument that uses changes in the polarization of light to measure the thickness and optical coefficients (refractive index and extinction coefficient) of a transparent or semi-transparent thin film.
The novel, custom-designed bearing units comprise a pair of angular contact, thin section, double-row bearings in a housed assembly, ready for fitting to the ellipsometer
is designed as a highly automated instrument to provide automatic goniometer, automatic XYZ stage, automatic sample adjustment and automatic microspot optics.
ULVAC also releases, the "UNECS-3000A", an automatic high-speed spectroscopic ellipsometer
which can measure the thickness of a thin film, as well as, optical constant.
Ellipsometric analyses were done by using a Gaertner ellipsometer
L116S, equipped with an HeNe laser ([lambda]=632.
nano size) might be used with an ellipsometer
to determine of the RI of these particles.
Standards were measured using the contact profilmeters, atomic force microscope, interference microscope, ellipsometer
and scanning tunneling microscope (STM).