extraordinary index

extraordinary index

[ik′strȯr·dən‚er·ē ′in‚deks]
(optics)
The index of refraction of the extraordinary wave propagating in a direction perpendicular to the optical axis of a uniaxial crystal.
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That is an extraordinary index of anxiety: Three-fourths of adult Filipinos say they worry that they or someone they know might be killed as the next victim of the President's rampaging war on drugs.
The LC used in the proposed structure is an anisotropic material consisting of rod like molecules which are characterized by ordinary index no and extraordinary index [n.sub.e].
Inwood contains about a hundred pages of notes and bibliography, more than twenty pages of maps and notes, sixty-six illustrations, and, finally, an extraordinary index of another fifty pages.
This is a handsome book, with wonderful illustrations and an extraordinary index compiled by Marilyn Bliss.
Thus, we assume that the degree of paracrystallinity in the direction corresponding to the extraordinary index, [Z.sub.i], is nearly equal to the mean paracrystalline distortion parameter, [Mathematical Expression Omitted], for low-density blown polyethylene films.
We may proceed similarly in the case of the extraordinary index. In Fig.
Hence, by finding [Mathematical Expression Omitted] the paracrystalline degree values are found whose partial effects appear in the direction of this neutral line (bulk extraordinary index), being equivalent their mean value, [Mathematical Expression Omitted], to the mean paracrystalline distortion parameter, [Mathematical Expression Omitted] (in percentage), as shown in Table 3.
[E.sub.i] is the electric field along the i axis, [R.sub.([Phi])] is the rotational matrix, with [Phi], the angle between the extraordinary index and the polarization axis of the HeNe beam; [W.sub.0], developed at Eq 4, represents the optical phase delay matrix; N is the number of layers used in the model:
The ordinary and extraordinary indexes have been set to [n.sub.e] = 1.6, [n.sub.e] = 1.62, and the thickness of the molecular layer is equal to the sample thickness divided by the number of layers d = 173/7000 [[micro]meter].

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