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The new technology enables quick and accurate determination of the rate at which soft errors in a LSI chip will be encountered, a rate that varies depending on such characteristics as the geometric latitude and altitude of the location, and the shield effect of buildings in which the LSI is employed.
Due to the fact that energy spectra of neutrons[4] are influenced by such characteristics as geometric latitude and altitude coordinates as well as the structure (shield effect) of buildings, measurements of soft error rates vary by location.