hot carrier

hot carrier

[′hät ¦kar·ē·ər]
(electronics)
A carrier, which may be either an electron or a hole, that has relatively high energy with respect to the carriers normally found in majority-carrier devices such as thin-film transistors.
References in periodicals archive ?
Cause of failure was attributed to a non-classical hot carrier mechanism affecting an NMOS transistor in the sense circuitry.
Steven Louie, a theoretical physicist and senior faculty scientist with Berkeley Lab's Materials Sciences Division, said: "Hot carrier thermalisa-tion is a major source of efficiency loss in solar cells but because of the sub-picosecond time scale and complex physics involved, characterisation of hot carriers has long been a challenge.
Some specific topics explored include phononic engineering for hot carrier solar cells, quantum dot solar cells, and quantum confinement modeling and simulation for quantum well solar cells.
Electronics, physics, materials, and chemistry are among the perspectives of the contributors as they review research into light-emitting diodes (LEDs) and Schottky, or hot carrier diodes and their design, fabrication, characteristics, and applications.
The demonstration of this hot electron transfer establishes that a highly efficient hot carrier solar cell is not just a theoretical concept, but an experimental possibility.
However, there needs to be caution, since alterations to these parts of the LDMOS structure may have a negative impact on hot carrier degradation (resulting in [I.
The qualified tools include the RelPro+(TM) and RelXpert(TM) products for Hot Carrier Injection (HCI) effects, and the AnalogXpert(TM) product for device mismatch simulation analysis for TSMC's analog/mixed-signal (AMS) process technologies.
Tenders are invited for Hot Carrier 5 Cups Knight Fire .
Specific topics discussed include gate dielectrics, the hot carrier effect, electromigration, negative bias temperature instability, plasma process-induced damage, and reliability of high-k gate dielectrics.
The tool includes modeling of key degradation mechanisms, such as Hot Carrier Injection (HCI) for MOSFETs and reverse-beta degradation for SiGe NPN transistors.
The effects of Ge composition and Si cap thickness on hot carrier reliability of Si/Si1-xGex/Si p-MOSFETs with high-k/metal gate - explores MOSFET performance characteristics and reliability under the effects of controlled stress, which is a common approach to boost performance in CMOS devices
Finally, imec introduced junction-less high-k metal-gate-all-around nanowires to improve on- and off-state hot carrier reliability.