inductive fault analysis


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inductive fault analysis

[in‚dək·tiv ′fȯlt ə‚nal·ə·səs]
(electronics)
A method of analyzing the effects of defects on an integrated circuit, in which a computer simulates an electron that scatters at random faults in the form of additional or missing areas of material on the set of drawings of the masks from which the circuits are fabricated.